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Noise and Vibration Mitigation for Rail Transportation Systems ; Proceedings of the 9th International Workshop on Railway Noise, Munich, Germany, 4 - 8 September 2007
This volume contains the contributions to the 9th International Workshop on Railway Noise, held Sept 04-08, 2007, in Munich, Germany. The workshop featured lectures by international leaders in the field of railway noise and vibration. All subjects relating to railway noise as noise sources (rolling noise, aerodynamic noise, bridge noise, sonic boom), prediction tools and theoretical models, new noise reduction, technology as well as ground-borne vibration are tackled.
Low-Frequency Noise in Advanced MOS Devices
Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits.
Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects. The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.
