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Carbon Nanotubes : Advanced Topics in the Synthesis, Structure, Properties and Applications
The carbon nanotubes field has evolved substantially since the publication of the bestseller "Carbon Nanotubes: Synthesis, Structure, Properties and Applications". The present volume builds on the generic aspects of the aforementioned book, which emphasizes the fundamentals, with the new volume emphasizing areas that have grown rapidly since the first volume, guiding future directions where research is needed and highlighting applications. The volume also includes an emphasis on areas like graphene, other carbon-like and other tube-like materials because these fields are likely to affect and influence developments in nanotubes in the next 5 years.
Applied scanning probe methods IX : Characterization
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale.
Applied scanning probe methods III : Characterization
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
Applied Physics of Carbon Nanotubes : Fundamentals of Theory, Optics and Transport Devices
The book describes the state-of-the-art in fundamental, applied and device physics of nanotubes, including fabrication, manipulation and characterization for device applications; optics of nanotubes; transport and electromechanical devices and fundamentals of theory for applications. This information is critical to the field of nanoscience since nanotubes have the potential to become a very significant electronic material for decades to come. The book will benefit all all readers interested in the application of nanotubes, either in their theoretical foundations or in newly developed characterization tools that may enable practical device fabrication.
