Applied scanning probe methods III : Characterization
- Author
- Bharat Bhushan, Harald Fuchs
- Publication Year
- 2006
- Publisher
- Springer
- Language
- English
- Document Type
- Book
- Faculty / Subject Heading
- Chemistry and Materials Science
- Download Book Read book
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
Keywords: Chemistry and Materials Science / AFM / Fulleren / Fullerene / STEM / Ceramics / Microscopy / Nanoparticle / Polymer / Spectroscopy
