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Analog-baseband architectures and circuits For multistandard and lowvoltage wireless transceivers
"Analog-Baseband Architectures and Circuits reviews the fundamentals and studies the state-of-the-art multistandard transceivers before describing novel architectural and circuit techniques for implementing multimode and wideband (tens of MHz) baseband analog front-ends under low-voltage constraints. Techniques developed on architecture level for efficient system-in-package (SiP) integration, testability and multi-standardability; and on circuit level for reducing the required supply voltage, power and area are generally applicable for most wireless systems, and are somewhat independent to technology scaling. Experimental 1-V baseband building blocks (i.e., double-quadrature-downconversion filter, programmable-gain amplifier and dc-offset canceler) and a 1-V fully-integrated receiver analog-baseband chain for IEEE 802.11a/b/g WLAN validate the techniques. The implementations are all in standard-VTH CMOS process, and no voltage boosting is required at any node." "Analog-Baseband Architectures and Circuits will be relevant to system architects, circuit designers, professors and students engaged in wireless transceiver front-ends research and development."
Analog integrated circuits for communication : principles, simulation and design
This book covers the analysis and design of nonlinear analog integrated circuits that form the basis of present-day communication systems. Both bipolar and MOS transistor circuits are analyzed and several numerical examples are used to illustrate the analysis and design techniques developed in this book.
Advances in Electronic Testing : Challenges and Methodologies
The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today’s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey. The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing.
Advances in Design and Specification Languages for Embedded Systems : Selected Contributions from FDL’06
Advances in Design and Specification Languages for Embedded Systems is the latest contribution to the Chip Design Languages series and it consists of selected papers presented at the Forum on Specifications and Design Languages (FDL'06), which took place in September 2006 at Technische Universität Darmstadt, Germany. FDL, an ECSI conference, is the premier European forum to present research results, to exchange experiences, and to learn about new trends in the application of specification and design languages as well as of associated design and modelling methods and tools for integrated circuits, embedded systems, and heterogeneous systems. Modelling and specification concepts push the development of new methodologies for design and verification to system level, they thus provide the means for a model-driven design of complex information processing systems in a variety of application domains.
Adaptive Multi-Standard RF Front-Ends
Adaptive Multi-Standard RF Front-Ends investigates solutions, benefits, limitations and costs related to multi-standard operation of RF front-ends and their adaptivity to variable radio environments. Next, it highlights the optimization of RF front-ends that allow achieving of maximal performance with a certain power budget while targeting full integration. Also, it investigates possibilities for low-voltage low-power circuit topologies in CMOS technology.
Abstraction Refinement for Large Scale Model Checking
This book describes recent research developments in automatic abstraction refinement techniques. The authors address the main challenge in abstraction refinement, i.e., the ability to efficiently reach or come close to the optimum abstraction (the smallest abstract model that proves or refutes the given property). A suite of fully automatic abstraction techniques are proposed to improve the overall computation efficiency. The suite of algorithms presented in this book has demonstrated significant improvement over the prior art; some of them have already been adopted by the EDA companies in their commercial/in-house verification tools.
