Advances in Electronic Testing : Challenges and Methodologies
- Author
- Dimitris Gizopoulos
- Publication Year
- 2006
- Publisher
- Springer
- Language
- English
- Document Type
- Book
- Faculty / Subject Heading
- Engineering
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The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today’s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey. The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing.
Keywords: Engineering / Advances in Testing / CMOS / Electronic Circuits Testing / Hardware / Integrated Circuits / Microelectronics Manufacturing / Testing Methodologies / Drift transistor / Integrated circuit / System on chip (SoC)
