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New Carbon Based Materials for Electrochemical Energy Storage Systems : Batteries, Supercapacitors and Fuel Cells
This NATO-ARW volume contains a diverse collection of papers addressing the role of carbon in some key electrochemical systems, both conventional and emerging. These papers discuss the latest issues associated with development, synthesis, characterization and use of new advanced carbonaceous materials for electrochemical energy storage. Such systems include: metal-air primary and rechargeable batteries, fuel cells, supercapacitors, cathodes and anodes of lithium-ion and lithium polymer rechargeable batteries, as well as nanocarbon materials of the future.
Modern Techniques for Characterizing Magnetic Materials
The book includes, but is not limited to the following areas: Magnetic neutron scattering with 3-axis spectrometer * Small-angle neutrons scattering * Polarized neutron magnetic reflectometry * Resonant soft x-ray magneto-optic scattering * Magnetic hard x-ray scattering * Spin resolved photoemission spectroscopy * Lorentz microscopy and electron holography * Scanning electron microscopy with polarization analysis * Spin polarized low energy electron microscopy * Spin-polarized scanning tunneling microscopy * Magnetic force microscopy * Near-field scanning optical microscopy * Time-resolved scanning Kerr microscopy * Brillouin light scattering spectroscopy
Microscopy of Semiconducting Materials 2007 ; Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK
The conference focused upon the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy, scanning probe microscopy and X-ray-based methods. Conference sessions concentrated on key topics including state-of-the-art studies in high resolution imaging and analytical electron microscopy, advanced scanning probe microscopy, scanning electron microscopy and focused ion beam applications, novel epitaxial layer phenomena, the properties of quantum nanostructures, III-nitride developments, GeSi/Si for advanced devices, metal-semiconductor contacts and silicides and the important effects of critical device processing treatments.
Microscopy of Semiconducting Materials ; Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.
Handbook of microscopy for nanotechnology
Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Frontiers in Materials Research
This book covers recent progress in advanced materials research as reviewed by forefront researchers in contributions which would also be suitable for researchers and postgraduates in a related field. It starts with comprehensive reviews of exotic materials for electronic devices, such as wide gap semiconductors and organic materials. They are followed by recent topics on eco- and bio-friendly materials, which attract more and more attention in the materials research community. Atomic scale characterization and control of nanostructured materials are discussed in later chapters that review the general possibilities for precise control of structures and properties in the developments of advanced materials.
Ferroptosis : Methods and protocols
A comprehensive collection of experimental protocols for investigating ferroptosis in different systems, including cultured cells, animal models, and human tissues. The techniques covered in this book look at various aspects of ferroptosis ranging from the detection of lipid peroxidation to the measurement of glutathione peroxidase activity and the evaluation of mitochondrial morphology. Chapters also discuss basic molecular biology methods such as quantitative PCR and immunoblotting, and advanced imaging techniques such as transmission electron microscopy and confocal fluorescence microscopy. Written in the highly successful Methods in Molecular Biology series format, chapters include introductions to their respective topics, lists of the necessary materials and reagents, step-by-step, readily reproducible laboratory protocols, and tips on troubleshooting and avoiding known pitfalls.
Electron Microscopy of Polymers
There are many books on electron microscopy, however, the study of polymers using EM necessitates special techniques, precautions and preparation methods, including ultramicrotomy. This book discusses the general characteristics of the various techniques of EM, including scanning force microscopy (AFM). The application of these techniques to the study of morphology and properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Electron crystallography : Novel approaches for structure determination of nanosized materials
During the last decade we have been witness to several exciting achievements in electron crystallography. This includes structural and charge density studies on organic molecules complicated inorganic and metallic materials in the amorphous, nano-, meso- and quasi-crystalline state and also development of new software, tailor-made for the special needs of electron crystallography. This volume comprises the proceedings of the NATO Advanced Study Institute on Electron Crystallography: Novel Approaches for Structure Determination of Nanosized Materials, Erice, Italy, 10 - 24 June 2004
Materials Fundamentals of Gate Dielectrics
This book presents materials fundamentals of novel gate dielectrics that are being introduced into semiconductor manufacturing to ensure the continuous scalling of the CMOS devices. This is a very fast evolving field of research so we choose to focus on the basic understanding of the structure, thermodunamics, and electronic properties of these materials that determine their performance in device applications. Most of these materials are transition metal oxides. Ironically, the d-orbitals responsible for the high dielectric constant cause sever integration difficulties thus intrinsically limiting high-k dielectrics. Though new in the electronics industry many of these materials are wel known in the field of ceramics, and we describe this unique connection. The complexity of the structure-property relations in TM oxides makes the use of the state of the art first-principles calculations necessary. Several chapters give a detailed description of the modern theory of polarization, and heterojunction band discontinuity within the framework of the density functional theory. Experimental methods include oxide melt solution calorimetry and differential scanning calorimetry, Raman scattering and other optical characterization techniques, transmission electron microscopy, and x-ray photoelectron spectroscopy.
Kinetics of Catalytic Reactions--Solutions Manual
This textbook contains all the information needed for graduate students or industrial researchers to design kinetic experiments involving heterogeneous catalysts, to characterize these catalysts, to acquire valid rate data, to verify the absence of mass (and heat) transfer limitations, to propose reaction models, to derive rate expressions based on these models and, finally, to assess the consistency of these rate equations.The most recent technique to calculate heats of adsorption and activation barriers on metal surfaces, the BOC-MP approach, is discussed in detail. Methods to measure metal surface areas and crystallite sizes using x-ray diffraction, transmission electron microscopy and various chemisorption techniques are discussed. Different experimental techniques to determine the influence of mass transfer limitations, especially within the pores of a catalyst, are reviewed in detail, with a particular emphasis on liquid-phase reactions.
