Applied scanning probe methods V : Scanning probe microscopy techniques

Applied scanning probe methods V : Scanning probe microscopy techniques

Author
Bharat Bhushan, Satoshi Kawata, Harald Fuchs
Publication Year
2007
Publisher
Springer
Language
English
Document Type
Book
Faculty / Subject Heading
Chemistry and Materials Science

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series.


Keywords: Chemistry and Materials Science / AFM / PeS / ReM / Raman spectroscopy /ceramics / elasticity / Liquid / Microscopy / Modeling / Polymer / Spectroscopy