Matching Properties of Deep Sub-Micron MOS Transistors
- Author
- Jeroen A. Croon, Willy Sansen, Herman E. Maes
- Publication Year
- 2005
- Publisher
- Springer
- Language
- English
- Document Type
- Book
- Faculty / Subject Heading
- Computer Science
- Download Book Read book
Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield.
Keywords: Engineering / CMOS / MOSFET matching / MOSFET modeling / Transistor / Device characterization / Field-effect transistor /line-edge roughness / Metal oxide semiconductur field-effect transistor / Parameter fluctuations / Zitter
