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Full-Chip Nanometer Routing Techniques
From a manufacturability standpoint, nanometer routers must explicitly deal with the ever increasing design complexity, and be capable of adapting to the constraint requirements of timing, signal integrity, process antenna effect, and new interconnect architecture such as X-architecture. In the nanometer era, we must look into new-generation routing technologies that combine high performance and capacity with the integration of congestion, timing, SI prevention, and DFM algorithms as the best means of getting to design closure quickly. In this book, we present a novel multilevel full-chip router, namely mSIGMA for SIGnal-integrity and MAnufacturability optimization. And these routing technologies will ensure faster time-to-market and time-to-profitability
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thickness and interconnect dimensions goes well beyond acceptable limits, new test methodologies and a deeper insight into the physics of defect-fault mappings are needed. In Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits state of the art of defect-oriented testing is presented from both a theoretical approach as well as from a practical point of view. Step-by-step handling of defect modeling, defect-oriented testing, yield modeling and its usage in common economics practices enables deeper understanding of concepts.
