الصفحة 1
الصفحة 1
High Confidence Software Reuse in Large Systems ; 10th International Conference on Software Reuse, ICSR 2008, Beijing, China, May 25-29, 2008 Proceedings
This book constitutes the refereed proceedings of the 10th International Conference on Software Reuse, ICSR 2008, held in Beijing, China, in May 2008.The 40 revised full papers presented together with 5 workshop summaries and 5 tutorials were carefully reviewed and selected from numerous submissions. The papers are organized in topical sections on architecture and reuse approaches, high confidence and reuse, component selection and reuse repository, product line, domain models and analysis, service oriented environment, components and services, reuse approaches and frameworks, as well as reuse approaches and methods.
Dynamics of MEMS : Models, Methods, Experiments and Applications
This work presents a systematic view of the dynamics of MEMS (microelectromechanical systems), microstructures, and their responses. The focus is on the mecahnical/structural micro domain and the compliant nature of mechanical transmission. Features of this work include: An in-depth treatment of problems that involve reliable modeling, analysis and design, Analytical models with correct dependences on service dimensions, Cantilever based systems for nanofabrication researchers and designers, and Dynamics of complex spring and beam microsystems.
Computational Techniques for Voltage Stability Assessment and Control
The key concepts of both saddle node and Hopf bifurcation are covered. These are illustrated with the differential-algebraic equation (DAE) model of the system. The model is complex enough to include Load Tap-Changing transformers as well as HVDC models. The dynamic model of the generating unit includes the exciter since it plays a crucial role in voltage stability. A promising decoupled dynamic simulation technique is introduced for time domain analysis. Computational Techniques for Voltage Stability Assessment and Control provides the computational tools and algorithms needed for development of on-line voltage security assessment
