الصفحة 1
الصفحة 1
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Fault Diagnosis and Tolerance in Cryptography ; 3rd International Workshop, FDTC 2006, Yokohama, Japan, October 10, 2006, Proceedings

The sophistication of the underlying cryptographic algorithms, the high complexity of the implementations, and the easy access and low cost of cryptographic devices resulted in increased concerns regarding the reliability and security of crypto-devices. The effectiveness of side channel attacks on cryptographic devices, like timing and power-based attacks, has been known for some time. Several recent investigations have demonstrated the need to develop methodologies and techniques for designing robust cryptographic systems (both hardware and software) to protect them against both accidental faults and maliciously injected faults with the purpose of extracting the secret key. This trend has been particularly motivated by the fact that the equipment needed to carry out a successful side channel attack based on fault injection is easily accessible at a relatively low cost (for example, laser beam technology), and that the skills needed to use it are quite common.

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Control of Dead-time Processes

Control of Dead-time Processes introduces the fundamental techniques for controlling dead-time processes ranging from simple monovariable to complex multivariable cases. Solutions to dead-time-process-control problems are studied using classical proportional-integral-differential (PID) control for the simpler examples and dead-time-compensator (DTC) and model predictive control (MPC) methods for progressively more complex ones. Although MPC and DTC approaches originate in different areas of control, both use predictors to overcome the effects of dead time. Using this fact, the text analyses MPC as a dead-time-compensation strategy and shows how it can be used synergistically with robust DTC tuning methodologies.

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