الصفحة 1
الصفحة 1
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Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.

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Advanced Time-Correlated Single Photon Counting Techniques

Time-correlated single photon counting (TCSPC) is a remarkable technique for recording low-level light signals with extremely high precision and picosecond-time resolution. TCSPC has developed from an intrinsically time-consuming and one-dimensional technique into a fast, multi-dimensional technique to record light signals. So this reference and text describes how advanced TCSPC techniques work and demonstrates their application to time-resolved laser scanning microscopy, single molecule spectroscopy, photon correlation experiments, and diffuse optical tomography of biological tissue. It gives practical hints about constructing suitable optical systems, choosing and using detectors, detector safety, preamplifiers, and using the control features and optimising the operating conditions of TCSPC devices. Advanced TCSPC Techniques is an indispensable tool for everyone in research and development who is confronted with the task of recording low-intensity light signals in the picosecond and nanosecond range.

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