الصفحة 1
الصفحة 1
Electronic Imaging in Astronomy : Detectors and Instrumentation
The second edition of Electronic Imaging in Astronomy: Detectors and Instrumentation describes the remarkable developments that have taken place in astronomical detectors and instrumentation in recent years – from the invention of the charge-coupled device (CCD) in 1970 to the current era of very large telescopes, such as the Keck 10-meter telescopes in Hawaii with their laser guide-star adaptive optics which rival the image quality of the Hubble Space Telescope. Authored by one of the world’s foremost experts on the design and development of electronic imaging systems for astronomy, this book has been written on several levels to appeal to a broad readership. Mathematical expositions are designed to encourage a wider audience, especially among the growing community of amateur astronomers with small telescopes with CCD cameras.
Creating and Enhancing Digital Astro Images
Digital imaging is now available to all amateur astronomers at a reasonable price. The advent of CCDs, DSLRs and – perhaps most significantly – webcams mean today’s astronomers can make colorful planetary or deep-sky images of breathtaking beauty. The results obtained with even modest equipment can be spectacular, but of course they depend crucially on the computer processing of the images after they have been captured. Enhancing Digital Images is not just an introduction to image processing, it is a deeply practical, comprehensive and fully illustrated in-depth guide to using a digital camera, performing image reduction and undertaking image enhancement – all without jargon or math. Here is everything you need to know about processing digital astronomical images, regardless of whether you are experienced or a relative beginner!
CCD Image Sensors in Deep-Ultraviolet : Degradation Behavior and Damage Mechanisms
As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are emerging. For example, the new generation of semiconductor inspection systems is being pushed to image at increasingly shorter DUV wavelengths to facilitate inspection of deep sub-micron features in integrated circuits. DUV-sensitive charge-coupled device (CCD) cameras are in demand for these applications. Although CCD cameras that are responsive at DUV wavelengths are now available, their long-term stability is still a major concern. This book describes the degradation mechanisms and long-term performance of CCDs in the DUV, along with new results of device performance at these wavelengths.
