Defects in High-k Gate Dielectric Stacks : Nano-Electronic Semiconductor Devices
One of the key obstacles to high-k integration into Si nano-technology are the electronic defects in high-k materials. It has been established that defects do exist in high-k dielectrics and they play an important role in device operation. However, very little is known about the nature of the defects or about possible techniques to eliminate, or at least minimize them. Given the absence of a feasible alternative in the near future, well-focused scientific research and aggressive development programs on high-k gate dielectrics and related devices must continue for semiconductor electronics to remain a competitive income producing force in the global market.
كتب مشابهة
Hotel building in Damascus city
Show a hotel building in Damascus. The project is a facility consisting of one basement use as a storage rooms and shelter, and ground story and twelve story.
A structural study and study of the site of Al-Rahma hospital - Deir Ez-Zour
Presents the structural study and design of Al-Rahma Hospital, located in Deir Ez-Zour, Al-Kanamat area near the Euphrates River. The hospital includes two basement levels and ten floors above ground. The basements house medical imaging rooms, storage spaces, and a shelter.
Introduction to finite element analysis : A textbook for engineering students
Covers the basic concepts and applications of finite element analysis. It is specifically aimed at introducing this advanced topic to undergraduate-level engineering students and practicing engineers in a lucid manner. It also introduces a structural and heat transfer analysis software FEASTSMT which has wide applications in civil, mechanical, nuclear and automobile engineering domains.
Fundamentals of durable reinforced concrete
The book presents a framework for specification through internationally adopted codes and standards and summarises the background to probabilistic approaches to durability design, providing a state-of-the-art review of mathematical modelling of deterioration mechanisms along with current directions in test methods for performance-based specifications.
