The present volume 47 of the Advances in Solid State Physics contains the written version of a large number of the invited ...
Lee masThe sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first ...
Lee masThe sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first ...
Lee masThe success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...
Lee masThe scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ...
Lee masThe scanning probe microscopy feld has been rapidly expanding. It is a demanding task to collect a timely overview of this ...
Lee masThe present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics ...
Lee masThe success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...
Lee masThe success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...
Lee masIn the past twenty years, powerful tools such as atomic force microscopy have made it possible to accurately investigate ...
Lee masScanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, ...
Lee masScanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with ...
Lee masScanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at ...
Lee masTis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric ...
Lee mas