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Applying the Kaizen in Africa : A New Avenue for Industrial Development
At present, how to develop industries is a burning issue in Africa, where population growth remains high and economic development has thus far failed to provide sufficient jobs for many, especially young people and women. The creation of productive jobs through industrial development ought to be a central issue in steering economic activity across the continent.The authors of this book, consisting of two development economists and five practitioners, argue that the adoption of Kaizen management practices, which originated in Japan and have become widely used by manufacturers in advanced and emerging economies, is decisively the most effective first step for industrial development in Africa.This open access book discusses what Kaizen management is, why it is applicable to Africa, and why it can provide Africa with a springboard for sustainable economic growth and employment generation.
Applying the building code : Step-by-step guidance for design and building professionals
The IBC and its complementary codes provide design and construction professionals with a complete set of comprehensive, coordinated building safety and fire prevention regulations in order to safeguard the public health and general welfare of the occupants of new and existing buildings and structures. Adopted throughout most of the United States and its territories, it is referenced by federal agencies, such as the General Services Administration, National Park Service, Department of State, U.S. Forest Service, and the Department of Defense. For architects and other design and construction professionals, it is particularly important that they understand how to apply the IBC and how code officials view buildings, so that they integrate code-required provisions in the earliest design stages of any project.
Applying reflective equilibrium : Towards the justification of a precautionary principle
This book provides the first explicit case study for an application of the method of reflective equilibrium (RE), using it to develop and defend a precautionary principle. It thereby makes an important and original contribution to questions of philosophical method and methodology. The book shows step-by-step how RE is applied, and develops a methodological framework which will be useful for everyone who wishes to use reflective equilibrium. With respect to precautionary principles, the book demonstrates how a rights-based precautionary principle can be constructed and defended.
Applied Stratigraphy
This book aims to incorporate major aspects and essential elements underpinning the modern applications and perspectives of stratigraphy. It focuses on traditional and innovative techniques and how these can be utilized in reconstructing the geological history of sedimentary basins and in solving manifold geological problems and phenomena. Each chapter summarizes contributions by leading researchers in the field. It is hoped that this book will provide the reader with key insights into all these aspects and applications.
Applied Stochastic Control of Jump Diffusions
The main purpose of the book is to give a rigorous, yet mostly nontechnical, introduction to the most important and useful solution methods of various types of stochastic control problems for jump diffusionsThe types of control problems covered include classical stochastic control, optimal stopping, impulse control and singular control. Both the dynamic programming method and the maximum principle method are discussed, as well as the relation between them. Corresponding verification theorems involving the Hamilton-Jacobi Bellman equation and/or (quasi-)variational inequalities are formulated. There are also chapters on the viscosity solution formulation and numerical methods.The text emphasises applications, mostly to finance. All the main results are illustrated by examples and exercises appear at the end of each chapter with complete solutions. This will help the reader understand the theory and see how to apply it.The book assumes some basic knowledge of stochastic analysis, measure theory and partial differential equations.
Applied Statistics Using SPSS, STATISTICA, MATLAB and R
The book provides a comprehensive coverage of the main statistical analysis topics important for practical applications such as data description, statistical inference, classification and regression, factor analysis, survival data and directional statistics.
Applied soft computing technologies : The challenge of complexity
This volume presents the proceedings of the 9th Online World Conference on Soft Computing in Industrial Applications (WSC9), September 20th - October 08th, 2004, held on the World Wide Web. It contains plenary lectures, original papers and tutorials presented during the conference. The book brings together outstanding research and developments in the field of soft computing (evolutionary computation, fuzzy logic, neural networks, and their fusion) and its applications in science and technology.
Applied Semi-Markov Processes
The book presents homogeneous and non-homogeneous semi-Markov processes, as well as Markov and semi-Markov rewards processes. These concepts are fundamental for many applications, but they are not as thoroughly presented in other books on the subject as they are here.This book is intended for graduate students and researchers in mathematics, operations research and engineering; it might also appeal to actuaries and financial managers, and anyone interested in its applications for banks, mechanical industries for reliability aspects, and insurance companies.
Applied scanning probe methodsVII : Biomimetics and industrial applications
The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
Applied scanning probe methods X : Biomimetics and industrial applications
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, specialized scanning probe methods in life sciences including new self sensing cantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale.
Applied scanning probe methods VIII : Scanning probe microscopy techniques
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale.
Applied scanning probe methods VI : Characterization
The scanning probe microscopy feld has been rapidly expanding. It is a demanding task to collect a timely overview of this feld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching felds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series
Applied scanning probe methods V : Scanning probe microscopy techniques
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series.
Applied scanning probe methods IX : Characterization
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale.
Applied scanning probe methods IV : Industrial applications
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
Applied scanning probe methods III : Characterization
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
Applied scanning probe methods II : Scanning probe microscopy techniques
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
Applied Research in Uncertainty Modeling and Analysis
For a long time uncertainty has been considered synonymous with random, stochastic, statistic, or probabilistic. Since the early sixties views on uncertainty have become more heterogeneous. In the past forty years numerous tools that model uncertainty, above and beyond statistics, have been proposed by several engineers and scientists. The tool/method to model uncertainty in a specific context should really be chosen by considering the features of the phenomenon under consideration, not independent of what is known about the system and what causes uncertainty. In this fascinating overview of the field, the authors provide broad coverage of uncertainty analysis/modeling and its application. Applied Research in Uncertainty Modeling and Analysis presents the perspectives of various researchers and practitioners on uncertainty analysis and modeling outside their own fields and domain expertise. Rather than focusing explicitly on theory, the authors use real-world examples to demonstrate the strength of the chosen methodology. Applied Research in Uncertainty Modeling and Analysis concentrates on general aspects of uncertainty, modeling, and methods, and focuses on various applications, included Biomedical Engineering, Chemical Engineering, Structural Engineering, and Transportation Engineering.
Applied Rasch Measurement : A Book of Exemplars : Papers in Honour of John P. Keeves
While the primary purpose of the book is a celebration of John’s contributions to the field of measurement, a second and related purpose is to provide a useful resource. We believe that the combination of the developmental history and theory of the method, the examples of its use in practice, some possible future directions, and software and data files will make this book a valuable resource for teachers and scholars of the Rasch method. This book is a tribute to Professor John P Keeves for the advocacy of the Rasch model in Australia.
Applied Physics of Carbon Nanotubes : Fundamentals of Theory, Optics and Transport Devices
The book describes the state-of-the-art in fundamental, applied and device physics of nanotubes, including fabrication, manipulation and characterization for device applications; optics of nanotubes; transport and electromechanical devices and fundamentals of theory for applications. This information is critical to the field of nanoscience since nanotubes have the potential to become a very significant electronic material for decades to come. The book will benefit all all readers interested in the application of nanotubes, either in their theoretical foundations or in newly developed characterization tools that may enable practical device fabrication.
