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Applied Stochastic Control of Jump Diffusions
The main purpose of the book is to give a rigorous, yet mostly nontechnical, introduction to the most important and useful solution methods of various types of stochastic control problems for jump diffusions and its applications.
Applied Stochastic Control of Jump Diffusions
The main purpose of the book is to give a rigorous, yet mostly nontechnical, introduction to the most important and useful solution methods of various types of stochastic control problems for jump diffusionsThe types of control problems covered include classical stochastic control, optimal stopping, impulse control and singular control. Both the dynamic programming method and the maximum principle method are discussed, as well as the relation between them. Corresponding verification theorems involving the Hamilton-Jacobi Bellman equation and/or (quasi-)variational inequalities are formulated. There are also chapters on the viscosity solution formulation and numerical methods.The text emphasises applications, mostly to finance. All the main results are illustrated by examples and exercises appear at the end of each chapter with complete solutions. This will help the reader understand the theory and see how to apply it.The book assumes some basic knowledge of stochastic analysis, measure theory and partial differential equations.
Applied Statistics Using SPSS, STATISTICA, MATLAB and R
The book provides a comprehensive coverage of the main statistical analysis topics important for practical applications such as data description, statistical inference, classification and regression, factor analysis, survival data and directional statistics.
Applied soft computing technologies : The challenge of complexity
This volume presents the proceedings of the 9th Online World Conference on Soft Computing in Industrial Applications (WSC9), September 20th - October 08th, 2004, held on the World Wide Web. It contains plenary lectures, original papers and tutorials presented during the conference. The book brings together outstanding research and developments in the field of soft computing (evolutionary computation, fuzzy logic, neural networks, and their fusion) and its applications in science and technology.
Applied Semi-Markov Processes
The book presents homogeneous and non-homogeneous semi-Markov processes, as well as Markov and semi-Markov rewards processes. These concepts are fundamental for many applications, but they are not as thoroughly presented in other books on the subject as they are here.This book is intended for graduate students and researchers in mathematics, operations research and engineering; it might also appeal to actuaries and financial managers, and anyone interested in its applications for banks, mechanical industries for reliability aspects, and insurance companies.
Applied scanning probe methodsVII : Biomimetics and industrial applications
The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
Applied scanning probe methods X : Biomimetics and industrial applications
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, specialized scanning probe methods in life sciences including new self sensing cantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale.
Applied scanning probe methods VIII : Scanning probe microscopy techniques
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale.
Applied scanning probe methods VI : Characterization
The scanning probe microscopy feld has been rapidly expanding. It is a demanding task to collect a timely overview of this feld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching felds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series
Applied scanning probe methods V : Scanning probe microscopy techniques
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series.
Applied scanning probe methods IX : Characterization
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale.
Applied scanning probe methods IV : Industrial applications
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
Applied Research in Uncertainty Modeling and Analysis
For a long time uncertainty has been considered synonymous with random, stochastic, statistic, or probabilistic. Since the early sixties views on uncertainty have become more heterogeneous. In the past forty years numerous tools that model uncertainty, above and beyond statistics, have been proposed by several engineers and scientists. The tool/method to model uncertainty in a specific context should really be chosen by considering the features of the phenomenon under consideration, not independent of what is known about the system and what causes uncertainty. In this fascinating overview of the field, the authors provide broad coverage of uncertainty analysis/modeling and its application. Applied Research in Uncertainty Modeling and Analysis presents the perspectives of various researchers and practitioners on uncertainty analysis and modeling outside their own fields and domain expertise. Rather than focusing explicitly on theory, the authors use real-world examples to demonstrate the strength of the chosen methodology. Applied Research in Uncertainty Modeling and Analysis concentrates on general aspects of uncertainty, modeling, and methods, and focuses on various applications, included Biomedical Engineering, Chemical Engineering, Structural Engineering, and Transportation Engineering.
Applied Remote Sensing for Urban Planning, Governance and Sustainability
Despite the promising and exciting possibilities presented by new and fast-developing remote sensing technologies applied to urban areas, there is still a gap perceived between the generally academic and research-focused spectrum of results offered by the “urban remote sensing” community and the application of these data and products by the local governmental bodies of urban cities and regions. While there is no end of interesting science questions that we can ask about cities, sometimes these questions don't match well with what the operational problems and concerns of a given city are. The authors present data from six urban regions from all over the world. They explain what the important questions are, and how one can use data and scientific skills to help answer them.
Applied Physics of Carbon Nanotubes : Fundamentals of Theory, Optics and Transport Devices
The book describes the state-of-the-art in fundamental, applied and device physics of nanotubes, including fabrication, manipulation and characterization for device applications; optics of nanotubes; transport and electromechanical devices and fundamentals of theory for applications. This information is critical to the field of nanoscience since nanotubes have the potential to become a very significant electronic material for decades to come. The book will benefit all all readers interested in the application of nanotubes, either in their theoretical foundations or in newly developed characterization tools that may enable practical device fabrication.
Applied Pattern Recognition
The main goal of this book is to cover some of the latest application domains of pattern recognition while presenting novel techniques that have been developed or customized in those domains.
Applied Partial Differential Equations : A Visual Approach
This book presents selected topics in science and engineering from an applied-mathematics point of view. The described natural, socioeconomic, and engineering phenomena are modeled by partial differential equations that relate state variables.
Applied Parallel Computing ; State of the Art in Scientific Computing ; 8th International Workshop, PARA 2006, Umea, Sweden, June 18-21, 2006, Revised Selected Papers
It covers partial differential equations, parallel scientific computing algorithms, linear algebra, simulation environments, algorithms and applications for blue gene/L, scientific computing tools and applications, parallel search algorithms, peer-to-peer computing, mobility and security, algorithms for single-chip multiprocessors.
Applied Parallel Computing ; State of the Art in Scientific Computing
Introduction The PARA workshops in the past were devoted to parallel computing methods in science and technology. There have been seven PARA meetings to date: PARA’94, PARA’95 and PARA’96 in Lyngby, Denmark, PARA’98 in Umea, ? Sweden, PARA 2000 in Bergen, N- way, PARA 2002 in Espoo, Finland, and PARA 2004 again in Lyngby, Denmark. The ?rst six meetings featured lectures in modern numerical algorithms, computer science, en- neering, and industrial applications, all in the context of scienti?c parallel computing. This meeting in the series, the PARA 2004 Workshop with the title “State of the Art in Scienti?c Computing.
Applied Parallel Computing ; 6th International Conference, PARA 2002, Espoo, Finland, June 15-18, 2002. Proceeding
These proceedings contain the papers presented at PARA 2002, the Sixth In-ternational Conference on Applied Parallel Computing. PARA 2002 was held inEspoo, Finland, June 15–18, 2002, and hosted by CSC, the Finnish informationtechnology center for science. The general theme of the conference was advancedscientific computing.The conference demonstrated the ability of advanced scientific computing tosolve real-world problems, and highlighted methods, instruments, and trends infuture scientific computing. The conference began with a one-day tutorial sessionon Grid programming.The conference focused on an application-oriented, multi-disciplinary, andmulti-scale approach. A wide variety of scientific computing applications wereintroduced, from semiconductor processing and behavior of the human body tooceanic and atmospheric phenomena.
