A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by ...
Lire la suiteMicrosystems in many cases provided the key functions for this progress. Although the issues the event concentrated on didn’t ...
Lire la suiteOne of the key obstacles to high-k integration into Si nano-technology are the electronic defects in high-k materials. It ...
Lire la suiteFinFETs and Other Multi-Gate Transistors provides a comprehensive description of the physics, technology and circuit applications ...
Lire la suiteLow-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources ...
Lire la suiteMatching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause ...
Lire la suitemany works and results have been published which reinforce the importance of Current-Mode digital circuits. In the topic ...
Lire la suiteThis proceedings volume constitutes an archive of the contributions of the key-speakers who attended the NATO Advanced Research ...
Lire la suiteThe editors and authors present a wealth of knowledge regarding the most relevant aspects in the field of MOS transistor ...
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