Advances in Solid State Physics
The present volume 47 of the Advances in Solid State Physics contains the written version of a large number of the invited ...
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Applied Scanning Probe Methods III
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first ...
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Applied Scanning Probe Methods IV
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first ...
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Applied Scanning Probe Methods IX : Characterization
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...
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Applied Scanning Probe Methods V
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ...
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Applied Scanning Probe Methods VI
The scanning probe microscopy feld has been rapidly expanding. It is a demanding task to collect a timely overview of this ...
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Applied Scanning Probe Methods VII
The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics ...
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Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...
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Applied Scanning Probe Methods X : Biomimetics and Industrial Applications
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...
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Fundamentals of Friction and Wear on the Nanoscale
In the past twenty years, powerful tools such as atomic force microscopy have made it possible to accurately investigate ...
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Roadmap of Scanning Probe Microscopy
Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, ...
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Scanning Microscopy for Nanotechnology
Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with ...
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Scanning Probe Microscopy
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at ...
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Synthetic Polymeric Membranes : Characterization by Atomic Force Microscopy
Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric ...
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