The present volume 47 of the Advances in Solid State Physics contains the written version of a large number of the invited ...
Lire la suiteThe sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first ...
Lire la suiteThe sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first ...
Lire la suiteThe success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...
Lire la suiteThe scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ...
Lire la suiteThe scanning probe microscopy feld has been rapidly expanding. It is a demanding task to collect a timely overview of this ...
Lire la suiteThe present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics ...
Lire la suiteThe success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...
Lire la suiteThe success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...
Lire la suiteIn the past twenty years, powerful tools such as atomic force microscopy have made it possible to accurately investigate ...
Lire la suiteScanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, ...
Lire la suiteScanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with ...
Lire la suiteScanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at ...
Lire la suiteTis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric ...
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