Synthetic Polymeric Membranes : Characterization by Atomic Force Microscopy
Publication year: 2008
ISBN: 978-3-540-73994-4
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Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. Each chapter of this book includes information on basic principles, commercial applications, current research, and guidelines for future research.
Subject: Chemistry and Materials Science, AFM, Atomic Force Microscopy, Helium-Atom-Streuung, Membranes, PED, Polymer, Polymers, Surfaces, morphology, Polymer Sciences, Science, Humanities and Social Sciences, multidisciplinary, Industrial Chemistry, Chemical Engineering, Biomedicine, general, Analytical Chemistry, Food Science
