The economy of the 21st century in the OECD countries and in China, is characterized by a new phenomenon: the structural ...
Lee masScalable Hardware Verification with Symbolic Simulation presents recent advancements in symbolic simulation-based solutions ...
Lee masThe book tackles the problems that must be addressed before sensors are deployed for surveillance, tracking, and other monitoring ...
Lee masThe volume Scalable Optimization via Probabilistic Modeling: From Algorithms to Applications is a worthy addition to your ...
Lee masThis book constitutes the refereed proceedings of the First International Conference on Scalable Uncertainty Management, ...
Lee masThe book address artificial intelligence researchers, database researchers, and practitioners to demonstrate theoretical ...
Lee masThis book is devoted to the study of scalar and asymptotic scalar derivatives and their applications to some problems in ...
Lee masWelcome to the proceedings of the 5th International Conference on Scale-Space and PDE Methods in Computer Vision. The scale-space ...
Lee masConstitutes the refereed proceedings of the First International Conference on Scale Space Methods and Variational Methods ...
Lee masThis book constitutes the refereed proceedings of the Third International Conference on Scale-Space and Morphology in Computer ...
Lee masThis book is organized in topical sections on applied topic maps in industry and administration, visualisation and representation ...
Lee masThis book presents the Scaling Management Framework, a model based on collected experiences from companies that have already ...
Lee masThe book draws together a series of important case studies to provide a comprehensive review and synthesis of the most recent ...
Lee masThe book serves both as a reference for various scaled models with corresponding dimensionless numbers, and as a resource ...
Lee masThis guide gives an overview of SEM and sample processing for SEM and highlights several advances in cell and molecular biology ...
Lee masScanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with ...
Lee masScanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at ...
Lee masScanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students ...
Lee masAs the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties ...
Lee masThe Syrian market have relied on the basic scarcity product tactics, but creativity and uniqueness have become more in need, ...
Lee mas