Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by ...
Lee mas
Advanced Microsystems for Automotive Applications 2006
Microsystems in many cases provided the key functions for this progress. Although the issues the event concentrated on didn’t ...
Lee mas
Defects in High-k Gate Dielectric Stacks
One of the key obstacles to high-k integration into Si nano-technology are the electronic defects in high-k materials. It ...
Lee mas
FinFETs and Other Multi-Gate Transistors
FinFETs and Other Multi-Gate Transistors provides a comprehensive description of the physics, technology and circuit applications ...
Lee mas
Low-Frequency Noise in Advanced MOS Devices
Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources ...
Lee mas
Matching Properties of Deep Sub-Micron MOS Transistors
Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause ...
Lee mas
Model and Design of Bipolar and MOS Current-Mode Logic
many works and results have been published which reinforce the importance of Current-Mode digital circuits. In the topic ...
Lee mas
Nanoscaled Semiconductor-on-Insulator Structures and Devices
This proceedings volume constitutes an archive of the contributions of the key-speakers who attended the NATO Advanced Research ...
Lee mas
Transistor Level Modeling for Analog
The editors and authors present a wealth of knowledge regarding the most relevant aspects in the field of MOS transistor ...
Lee mas
