Publication year: 2005
ISBN: 978-0-387-25624-5
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SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications.
Subject: Engineering, Boundary Scan, SOC test design, System-on-Chip, Transistor, automation, consumption, integrated circuit