Design, Automation, and Test in Europe : The Most Influential Papers of 10 Years Date
Publication year: 2008
ISBN: 978-1-4020-6488-3
Internet Resource: Please Login to download book
The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.
Subject: Engineering, CMOS, Embedded System, IEEE 80, circuit, compiler, digital system, electronics, embedded systems, interconnect, network on chip (NoC), optimization, power management, router, routing, simulation, Circuits and Systems, Electronics and Microelectronics, Instrumentation, Computer Hardware, Computer Systems Organization and Communication Networks
