Book Details

Transmission Electron Microscopy and Diffractometry of Materials

Publication year: 2008

ISBN: 978-3-540-73886-2

Internet Resource: Please Login to download book

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM.

Subject: Chemistry and Materials Science, Crystallography, PES, REM, STEM, crystal, diffraction, electron diffraction, electron microscopy, microscopy, spectroscopy, transmission electron microscopy