Fundamentals of Nanoscale Film Analysis
Publication year: 2007
ISBN: 978-0-387-29261-8
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The book describes the fundamentals of materials characterization from the standpoint of the incident photons or particles which interrogate nanoscale structures. These induced reactions lead to the emission of a variety of detected of particles and photons. It is the energy and intensity of the detected beams that is the basis of the characterization of the materials. The array of experimental techniques used in nanoscale materials analysis covers a wide range of incident particle and detected beam interactions.
Subject: Chemistry and Materials Science, EXAFS, REM, diffraction, electron diffraction, integrated circuit, microscopy, spectroscopy
