Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Publication year: 2007
ISBN: 978-0-387-46547-0
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Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thickness and interconnect dimensions goes well beyond acceptable limits, new test methodologies and a deeper insight into the physics of defect-fault mappings are needed. In Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits state of the art of defect-oriented testing is presented from both a theoretical approach as well as from a practical point of view. Step-by-step handling of defect modeling, defect-oriented testing, yield modeling and its usage in common economics practices enables deeper understanding of concepts.
Subject: Engineering, CMOS, DSM, DfM, RAM, SRAM, VLSI, defects, integrated circuit, logic, testing, yield
