Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by ...
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Advanced Microsystems for Automotive Applications 2006
Microsystems in many cases provided the key functions for this progress. Although the issues the event concentrated on didn’t ...
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Defects in High-k Gate Dielectric Stacks
One of the key obstacles to high-k integration into Si nano-technology are the electronic defects in high-k materials. It ...
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FinFETs and Other Multi-Gate Transistors
FinFETs and Other Multi-Gate Transistors provides a comprehensive description of the physics, technology and circuit applications ...
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Low-Frequency Noise in Advanced MOS Devices
Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources ...
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Matching Properties of Deep Sub-Micron MOS Transistors
Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause ...
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Model and Design of Bipolar and MOS Current-Mode Logic
many works and results have been published which reinforce the importance of Current-Mode digital circuits. In the topic ...
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Nanoscaled Semiconductor-on-Insulator Structures and Devices
This proceedings volume constitutes an archive of the contributions of the key-speakers who attended the NATO Advanced Research ...
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Transistor Level Modeling for Analog
The editors and authors present a wealth of knowledge regarding the most relevant aspects in the field of MOS transistor ...
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