The present volume 47 of the Advances in Solid State Physics contains the written version of a large number of the invited ...
WeiterlesenThe sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first ...
WeiterlesenThe sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first ...
WeiterlesenThe success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...
WeiterlesenThe scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ...
WeiterlesenThe scanning probe microscopy feld has been rapidly expanding. It is a demanding task to collect a timely overview of this ...
WeiterlesenThe present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics ...
WeiterlesenThe success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...
WeiterlesenThe success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...
WeiterlesenIn the past twenty years, powerful tools such as atomic force microscopy have made it possible to accurately investigate ...
WeiterlesenScanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, ...
WeiterlesenScanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with ...
WeiterlesenScanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at ...
WeiterlesenTis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric ...
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