Data Mining and Diagnosing IC Fails
Publication year: 2005
: 978-0-387-26351-9
This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that profession manufacturing engineers can implement them in their own work environment
: Engineering, Data, Diagnosing, Fails, Huisman, Mining, Standard, diagnosis, integrated circuit, logic
