ESD Protection Device and Circuit Design for Advanced CMOS Technologies
Publication year: 2008
: 978-1-4020-8301-3
ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains.
: Engineering, CMOS, Circuit and device reliability, Circuit and device simulation, Double-diffused metal-oxide-semiconductor transistor, Electrical overstress (EOS), Electrostatic discharge (ESD), Latch-up, VLSI, bipolar junction transistor, bipolar power transistor, integrated circuit, logic
