Nanometer Technology Designs High-Quality Delay Tests
Publication year: 2008
: 978-0-387-75728-5
Nanometer Technology Designs: High-Quality Delay Tests discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the delay test for nanotechnology designs
: Engineering, ATPG, at-speed tests, defects, delay, fabrication, high quality, manufacturing, model, nanomanufacturing, nanometer, nanotechnology, test
