May 12,2018 Scientific research & Postgraduate Studies, ICT Engineering

Electric Parameter Evolutions Against Gatelength and Bias in Ultrashort Gate AlGaAs/GaAs HEMTs

Abstract

The electric parameter evolutions of state of the art ultrashort gate planar doped AlGaAs/GaAs HEMTs are studied against gatelength l/sub g/=0.4-0.1 mu m and bias. The best value of maximum intrinsic transconductance obtained is g/sub m0max/=800 mS/mm at l/sub g/=0.15 mu m and the measured cutoff frequency is f/sub t/=125 GHz at l/sub g/=0.1 mu m.

Link to read full paper

http://ieeexplore.ieee.org/abstract/document/211828/