May 12,2018
البحث العلمي والدراسات العليا, الهندسة المعلوماتية والاتصالات
Electric Parameter Evolutions Against Gatelength and Bias in Ultrashort Gate AlGaAs/GaAs HEMTs
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Published in |
Electronics Letters, Volume 29, Issue 7, 1 April 1993 |
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Abstract |
The electric parameter evolutions of state of the art ultrashort gate planar doped AlGaAs/GaAs HEMTs are studied against gatelength l/sub g/=0.4-0.1 mu m and bias. The best value of maximum intrinsic transconductance obtained is g/sub m0max/=800 mS/mm at l/sub g/=0.15 mu m and the measured cutoff frequency is f/sub t/=125 GHz at l/sub g/=0.1 mu m. |
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