Page 1
Page 1
Model and Design of Bipolar and MOS Current-Mode Logic : CML, ECL and SCL Digital Circuits
many works and results have been published which reinforce the importance of Current-Mode digital circuits. In the topic of Current-Mode digital circuits, the authors properly exploited classical paradigms developed and used in the analog circuit domain (a topic in which one of the authors maturated a great experience).
Microelectronic Circuits
Devices and basic circuits -- Signals, amplifiers and semiconductors -- Operational amplifiers -- Diodes -- Bipolar junction transistors (BJTS) -- Mos field-effect transistors (MOSFETS) -- Transistor amplifiers -- Analog integrated circuits -- Building blocks of integrated-circuit amplifiers -- Differential and multistage amplifiers -- Frequency response -- Feedback -- Output stages and power amplifiers -- Operational-amplifier circuits -- Filters and oscillators -- Digital integrated circuits -- CMOS digital logic circuits -- Digital Design: Power, Speed, and Area -- Memory and Clocking Circuits
Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation ; Vol. 4148 ; 16th International Workshop, PATMOS 2006, Montpellier, France, September 13-15, 2006, Proceedings
Welcome to the proceedings of PATMOS 2006, the 16th in a series of international workshops. PATMOS 2006 was organized by LIRMM with CAS technical - sponsorship and CEDA sponsorship. Over the years, the PATMOS workshop has evolved into an important European event, where researchers from both industry and academia discuss and investigate the emerging challenges in future and contemporary applications, design methodologies, and tools required for the development of upcoming generations of integrated circuits and systems. The technical program of PATMOS 2006 contained state-of-the-art technical contributions, three invited talks, a special session on hearing-aid design, and an embedded tutorial. The technical program focused on timing, performance and power consumption, as well as architectural aspects with particular emphasis on modeling, design, characterization, analysis and optimization in the nanometer era. The Technical Program Committee, with the assistance of additional expert reviewers, selected the 64 papers presented at PATMOS. The papers were organized into 11 technical sessions and 3 poster sessions. As is always the case with the PATMOS workshops, full papers were required, and several reviews were received per manuscript.
Fault Diagnosis of Analog Integrated Circuits
Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential.
Matching Properties of Deep Sub-Micron MOS Transistors
Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield.
