الصفحة 1
الصفحة 1
Netter's essential histology with correlated histopathology
Concise and easy to use, it integrates gross anatomy and embryology with classic histology slides and state-of-the-art scanning electron microscopy, offering a clear, visual understanding of this complex subject. Additional histopathology images, more clinical boxes, and new histopathology content ensure that this textbook-atlas clearly presents the most indispensable histologic concepts and their clinical relevance. Helps you recognize both normal and diseased structures at the microscopic level with the aid of succinct explanatory text as well as numerous clinical boxes. Features more histopathology content and additional clinical boxes to increase your knowledge of pathophysiology and clinical relevance. Includes high-quality light and electron micrographs, including enhanced and colorized electron micrographs that show ultra-structures in 3D, side by side with classic Netter illustrations that link your knowledge of anatomy and cell biology to what is seen in the micrographs.
Monograph of the Spathidiida (Ciliophora, Haptoria) ; Vol. I : Protospathidiidae, Arcuospathidiidae, Apertospathulidae
The present monograph carefully revises the taxonomy, nomenclature, and ecology of all nominal species and shows that spathidiid diversity has been greatly underestimated. Based on the reinvestigation of described species with modern methods (silver impregnation, scanning electron microscopy) and the first description of over 50 new species, the family Spathidiidae is split into four families and 20 genera. Each species is described and figured in detail, making it unnecessary to go back to the original literature often difficult to obtain. Two identification keys are provided, viz., one for taxonomists and another, simple key for users not specifically trained in ciliate taxonomy.
Modern Techniques for Characterizing Magnetic Materials
The book includes, but is not limited to the following areas: Magnetic neutron scattering with 3-axis spectrometer * Small-angle neutrons scattering * Polarized neutron magnetic reflectometry * Resonant soft x-ray magneto-optic scattering * Magnetic hard x-ray scattering * Spin resolved photoemission spectroscopy * Lorentz microscopy and electron holography * Scanning electron microscopy with polarization analysis * Spin polarized low energy electron microscopy * Spin-polarized scanning tunneling microscopy * Magnetic force microscopy * Near-field scanning optical microscopy * Time-resolved scanning Kerr microscopy * Brillouin light scattering spectroscopy
Microscopy of Semiconducting Materials 2007 ; Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK
The conference focused upon the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy, scanning probe microscopy and X-ray-based methods. Conference sessions concentrated on key topics including state-of-the-art studies in high resolution imaging and analytical electron microscopy, advanced scanning probe microscopy, scanning electron microscopy and focused ion beam applications, novel epitaxial layer phenomena, the properties of quantum nanostructures, III-nitride developments, GeSi/Si for advanced devices, metal-semiconductor contacts and silicides and the important effects of critical device processing treatments.
Microscopy of Semiconducting Materials ; Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.
Inorganic Constituents in Soil : Basics and Visuals
A must-read for students of and beginners in soil science. In a well-organized and easy-to-follow manner, it provides basic outlines of soil minerals, new methods and recent developments in the field, with a special focus on visual aids. The chapters on primary minerals, secondary minerals, non-crystalline inorganic constituents and inorganic constituents sensitive to varying redox conditions will help readers understand the basic components of soils. Further, readers are introduced to new analytical methods with the aid of microscopy and recent developments in the field. Uniquely, the book features case studies on the identification and isolation methods for vivianite crystals from paddy field soils, as well as a identical procedure for identifying noncrystalline constituents such as volcanic glasses and plant opals, which can also be applied to other soils depending on the local conditions.
Handbook of microscopy for nanotechnology
Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
EMC 2008 ; 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany ; Vol.1 : Instrumentation and Methods
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science
Biological Low-Voltage Scanning Electron Microscopy
Biological Low-Voltage Scanning Electron Microscopy is the first book to address both of these aspects of biological LVSEM. After providing a thorough description of the unique advantages and the operating constraints related to operating a scanning electron microscope at low beam voltage, the remainder of book focuses on the the best way to image all types of plant and animal cells and covers specimens that range from macromolecules to the surfaces revealed by de-embedding resin-embedded samples. Advanced specimen preparation techniques such as cryo-LVSEM, and immuno-gold-LVSEM are fully covered, as is x-ray microanalysis at low beam voltage and live-time stereo imaging. The preparative protocols provided represent the distilled essence of the experience of a group of world-renowned authors who have, for many decades, been instrumental in developing and applying new approaches to LVSEM to support their own biological research.
