الصفحة 1
الصفحة 1
Fault-Tolerance Techniques for SRAM-Based FPGAs
This book discusses fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs). It starts by showing the model of the problem and the upset effects in the programmable architecture. In the sequence, it shows the main fault tolerance techniques used nowadays to protect integrated circuits against errors. A large set of methods for designing fault tolerance systems in SRAM-based FPGAs is described. Some presented techniques are based on developing a new fault-tolerant architecture with new robustness FPGA elements. Other techniques are based on protecting the high-level hardware description before the synthesis in the FPGA.
Design of Wireless Autonomous Datalogger ICs
The book starts with a comprehensive introduction on the most important design aspects and trade-offs for miniaturized low-power telemetric dataloggers. After the general introduction follows an in-depth case study of an autonomous CMOS datalogger IC for the registration of in vivo loads on oral implants. After tackling the design of the datalogger on the system level, the design of the different building blocks is elaborated in detail, with emphasis on low power
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thickness and interconnect dimensions goes well beyond acceptable limits, new test methodologies and a deeper insight into the physics of defect-fault mappings are needed. In Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits state of the art of defect-oriented testing is presented from both a theoretical approach as well as from a practical point of view. Step-by-step handling of defect modeling, defect-oriented testing, yield modeling and its usage in common economics practices enables deeper understanding of concepts.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
Adaptive Techniques for Dynamic Processor Optimization : Theory and Practice
This book discusses the different approaches and responses to adaptive techniques used for processor power, frequency and functionality optimization. Adaptive Techniques for Dynamic Processor Optimization: Theory and Practice includes chapter contributions that explore promising approaches and present the supporting data.
