الصفحة 2
الصفحة 2
Applied scanning probe methods IX : Characterization
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale.
Applied scanning probe methods IV : Industrial applications
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
Applied scanning probe methods III : Characterization
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
Applied scanning probe methods II : Scanning probe microscopy techniques
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
Applied mathematics and machine learning
The simultaneous availability of large datasets and high-performance computing capability in recent years has enabled the rapid development of powerful machine learning algorithms. On the one hand, state-of-the-art machine learning techniques have transformed many areas of science and engineering; on the other hand, theoretical discoveries in mathematical algorithms, differential equations, and statistical inferences, to name a few, have provided the foundation for the exploration of new multidisciplinary models for solving practical problems. This Special Issue endeavors to continue the journey that started in our previous Special Issue (Applied Mathematics and Computational Physics) by providing a platform for researchers from both academia and industry, as well as government, to present their new computational methods that have engineering and physics applications.
Advances in Mass Data Analysis of Signals and Images in Medicine, Biotechnology and Chemistry ; International Conference, MDA 2006/2007, Leipzig, Germany, July 18, 2007, Selected Papers
The automatic analysis of images and signals in medicine, biotechnology, and chemistry is a challenging and demanding field. Signal-producing procedures by microscopes, spectrometers, and other sensors have found their way into wide fields of medicine, biotechnology, economy, and environmental analysis. With this arises the problem of the automatic mass analysis of signal information. Signal-interpreting systems which generate automatically the desired target statements from the signals are therefore of compelling necessity. The continuation of mass analyses on the basis of classical procedures leads to investments of proportions that are not feasible. New procedures and system architectures are therefore required. The goals of this: Provide a forum for identifying important contributions and opportunities for research on mass data analysis on microscopic images Promote the systematic study of how to apply automatic image analysis and interpretation procedures to that field Show case applications of mass data analysis in biology, medicine, and chemistry Topics of interest include (but are not limited to): Techniques and developments of signal and image producing procedures Object matching and object tracking in microscopic and video microscopic images 1D, 2D, and 3D shape analysis and description
