Matching Properties of Deep Sub-Micron MOS Transistors
المؤلف
Jeroen A. Croon, Willy Sansen, Herman E. Maes
سنة النشر
2005
الناشر
Springer
لغة الملف
انكليزي
نوع الوثيقة
Book
الموضوع الرئيسي / الكلية
Computer Science
Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield.
الكلمات المفتاحية: Engineering / CMOS / MOSFET matching / MOSFET modeling / Transistor / Device characterization / Field-effect transistor /line-edge roughness / Metal oxide semiconductur field-effect transistor / Parameter fluctuations / Zitter
