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Magnetic Microscopy of Nanostructures
Contains a comprehensive collection of overview articles on novel microscopy methods for imaging magnetic structures on the nanoscale. Written by leading scientists in the field the book covers synchrotron based methods, spin polarized electron methods, and scanning probe techniques. It will be a valuable source of reference for graduate students and newcomers to the field.
Magnetic Heterostructures : Advances and Perspectives in Spinstructures and Spintransport
Magnetic heterostructures constitute an important field in magnetism and nanotechnology, which has developed over the past fifteen years due to important advances in epitaxial- growth techniques and lithographic processes. Magnetic heterostructures combine different physical properties which do not exist in nature. Examples are semiconductors/ferromagnets, superconductors/ferromagnets, and ferromagnets/antiferromagnets. These combinations display rich and novel physical properties different from those that exit in any single one of them. Interlayer exchange coupling, exchange bias, proximity effects, giant magneto-resistance, tunneling magneto-resistance, spininjection and spintransport are examples of new physical phenomena that rely on the combination of different materials layers
Applied scanning probe methods IV : Industrial applications
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
Applied scanning probe methods III : Characterization
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
Applied scanning probe methods II : Scanning probe microscopy techniques
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
