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Astrophysics is easy! : An introduction for the amateur astronomer
With some justification, many amateur astronomers believe astrophysics is a very difficult subject, requiring at least degree-level mathematics to understand it properly. This isn’t necessarily the case. Mike Inglis' quantitative approach to the subject explains all aspects of astrophysics in simple terms and cuts through the incomprehensible mathematics with which this fascinating subject is all too often associated. Astrophysics is Easy! begins by looking at the H-R diagram and other basic tools of astrophysics, then ranges across the universe, from a first look at the interstellar medium and nebulae, through the birth, evolution and death of stars, to the physics of galaxies and clusters of galaxies.
Assessment and future directions of nonlinear model predictive control
Thepastthree decadeshaveseenrapiddevelopmentin the areaofmodelpred- tive control with respect to both theoretical and application aspects. Over these 30 years, model predictive control for linear systems has been widely applied, especially in the area of process control. However, today’s applications often require driving the process over a wide region and close to the boundaries of - erability, while satisfying constraints and achieving near-optimal performance. Consequently, the application of linear control methods does not always lead to satisfactory performance, and here nonlinear methods must be employed. This is one of the reasons why nonlinear model predictive control (NMPC) has - joyed signi?cant attention over the past years,with a number of recent advances on both the theoretical and application frontier. Additionally, the widespread availability and steadily increasing power of today’s computers, as well as the development of specially tailored numerical solution methods for NMPC, bring thepracticalapplicabilityofNMPCwithinreachevenforveryfastsystems.This has led to a series of new, exciting developments, along with new challenges in the area of NMPC.
Asian century … on a knife-edge : A 360 degree analysis of Asia's recent economic development
This book delves into the widely held belief that the 21st century will be the "Asian Century" by examining the Asia's rapid economic development in the post-war era and the challenges it faces in forging ahead of world leaders in the West. The impact of the current turbulent global political climate on Asia is critically analyzed, employing a holistic and multidisciplinary approach, combining economic, social, political and geopolitical perspectives. Written in an accessible style, the book offers students, business, government, and civil society players powerful insights on Asia.
Approximate and noisy realization of discrete-time dynamical systems
This monograph deals with approximation and noise cancellation of dynamical systems which include linear and nonlinear input/output relations. It will be of special interest to researchers, engineers and graduate students who have specialized in ?ltering theory and system theory. This monograph provides new results and their extensions which can also be applied to nonlinear dynamical systems.
Applying reflective equilibrium : Towards the justification of a precautionary principle
This book provides the first explicit case study for an application of the method of reflective equilibrium (RE), using it to develop and defend a precautionary principle. It thereby makes an important and original contribution to questions of philosophical method and methodology. The book shows step-by-step how RE is applied, and develops a methodological framework which will be useful for everyone who wishes to use reflective equilibrium. With respect to precautionary principles, the book demonstrates how a rights-based precautionary principle can be constructed and defended.
Applied Stratigraphy
This book aims to incorporate major aspects and essential elements underpinning the modern applications and perspectives of stratigraphy. It focuses on traditional and innovative techniques and how these can be utilized in reconstructing the geological history of sedimentary basins and in solving manifold geological problems and phenomena. Each chapter summarizes contributions by leading researchers in the field. It is hoped that this book will provide the reader with key insights into all these aspects and applications.
Applied Stochastic Processes
Applied Stochastic Processes uses a distinctly applied framework to present the most important topics in the field of stochastic processes.
Applied Stochastic Control of Jump Diffusions
The main purpose of the book is to give a rigorous, yet mostly nontechnical, introduction to the most important and useful solution methods of various types of stochastic control problems for jump diffusions and its applications.
Applied Stochastic Control of Jump Diffusions
The main purpose of the book is to give a rigorous, yet mostly nontechnical, introduction to the most important and useful solution methods of various types of stochastic control problems for jump diffusionsThe types of control problems covered include classical stochastic control, optimal stopping, impulse control and singular control. Both the dynamic programming method and the maximum principle method are discussed, as well as the relation between them. Corresponding verification theorems involving the Hamilton-Jacobi Bellman equation and/or (quasi-)variational inequalities are formulated. There are also chapters on the viscosity solution formulation and numerical methods.The text emphasises applications, mostly to finance. All the main results are illustrated by examples and exercises appear at the end of each chapter with complete solutions. This will help the reader understand the theory and see how to apply it.The book assumes some basic knowledge of stochastic analysis, measure theory and partial differential equations.
Applied Statistics Using SPSS, STATISTICA, MATLAB and R
The book provides a comprehensive coverage of the main statistical analysis topics important for practical applications such as data description, statistical inference, classification and regression, factor analysis, survival data and directional statistics.
Applied soft computing technologies : The challenge of complexity
This volume presents the proceedings of the 9th Online World Conference on Soft Computing in Industrial Applications (WSC9), September 20th - October 08th, 2004, held on the World Wide Web. It contains plenary lectures, original papers and tutorials presented during the conference. The book brings together outstanding research and developments in the field of soft computing (evolutionary computation, fuzzy logic, neural networks, and their fusion) and its applications in science and technology.
Applied Semi-Markov Processes
The book presents homogeneous and non-homogeneous semi-Markov processes, as well as Markov and semi-Markov rewards processes. These concepts are fundamental for many applications, but they are not as thoroughly presented in other books on the subject as they are here.This book is intended for graduate students and researchers in mathematics, operations research and engineering; it might also appeal to actuaries and financial managers, and anyone interested in its applications for banks, mechanical industries for reliability aspects, and insurance companies.
Applied scanning probe methodsVII : Biomimetics and industrial applications
The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
Applied scanning probe methods X : Biomimetics and industrial applications
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, specialized scanning probe methods in life sciences including new self sensing cantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale.
Applied scanning probe methods VIII : Scanning probe microscopy techniques
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale.
Applied scanning probe methods VI : Characterization
The scanning probe microscopy feld has been rapidly expanding. It is a demanding task to collect a timely overview of this feld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching felds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series
Applied scanning probe methods V : Scanning probe microscopy techniques
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series.
Applied scanning probe methods IX : Characterization
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale.
Applied scanning probe methods IV : Industrial applications
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
Applied scanning probe methods III : Characterization
The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron.
