الصفحة 1
الصفحة 1
Data Mining and Diagnosing IC Fails
This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that profession manufacturing engineers can implement them in their own work environment
Construction and Analysis of Safe, Secure, and Interoperable Smart Devices ; Vol. 3956 ; Second International Workshop, CASSIS 2005, Nice, France, March 8-11, 2005, Revised Selected Papers
This book constitutes the refereed post-proceedings of the Second International Workshop on Construction and Analysis of Safe, Secure, and Interoperable Smart Devices, CASSIS 2005. The 9 revised full papers presented were carefully selected during two rounds of reviewing and improvement from about 30 workshop talks. The papers are organized in topical sections on research trends in smart devices, Web services, virtual machine technology, security, validation and formal methods, proof-carrying code, and embedded devices.
Construction and analysis of safe, secure, and interoperable smart devices ; Vol. 3362 : International workshop, CASSIS 2004, Marseille, France, March 10-14, 2004, Revised Selected Papers
History based access control and secure information flow / The spec# programming system / Mastering test generation from smart card software formal models / A mechanism for secure, fine-grained dynamic provisioning of applications on small devices / A type system for checking applet isolation in java card / Verification of safety properties in the presence of transactions / Modelling mobility aspects of security policies / Smart devices for next generation mobile services / A flexible framework for the estimation of coverage metrics in explicit state software model checking / Combining several paradigms for circuit validation and verification / Smart card research perspectives
