الكتب الالكترونية

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978-3-540-74325-5
Advances in Solid State Physics

The present volume 47 of the Advances in Solid State Physics contains the written version of a large number of the invited ...

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978-3-540-26910-6
Applied Scanning Probe Methods III

The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first ...

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978-3-540-26914-4
Applied Scanning Probe Methods IV

The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At first ...

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978-3-540-74083-4
Applied Scanning Probe Methods IX : Characterization

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...

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978-3-540-37316-2
Applied Scanning Probe Methods V

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ...

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978-3-540-37319-3
Applied Scanning Probe Methods VI

The scanning probe microscopy feld has been rapidly expanding. It is a demanding task to collect a timely overview of this ...

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978-3-540-37321-6
Applied Scanning Probe Methods VII

The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics ...

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978-3-540-74080-3
Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...

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978-3-540-74085-8
Applied Scanning Probe Methods X : Biomimetics and Industrial Applications

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning ...

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978-3-540-36807-6
Fundamentals of Friction and Wear on the Nanoscale

In the past twenty years, powerful tools such as atomic force microscopy have made it possible to accurately investigate ...

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978-3-540-34315-8
Roadmap of Scanning Probe Microscopy

Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, ...

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978-0-387-39620-0
Scanning Microscopy for Nanotechnology

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with ...

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978-0-387-28668-6
Scanning Probe Microscopy

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at ...

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978-3-540-73994-4
Synthetic Polymeric Membranes : Characterization by Atomic Force Microscopy

Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric ...

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