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The technical program of SPLC 2005 included. – two keynotes from David Weiss (Avaya, USA) and Jan Bosch (Nokia, F- land), both leading experts with academic and industrial insights; – 17 full and 3 short research papers organized around the following themes: feature modeling, re-engineering, strategies, validation, scoping and arc- tecture, and product derivation; – eight experience reports describing commercial application of product line practices; – two panels focused on special topics in product line practice and product line research; – tool demonstrations; – aHallofFamesessionthatcontinuedtheSPLCtraditioninaslightlyrevised format. In addition, the technical program was preceded by a tutorial and workshop day that included ten half-day tutorials presented by well-recognized experts and ?ve workshops on speci?c areas of product line research.