Publication Date: 2008
ISBN: 978-1-4020-8166-8
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The book reports modeling and simulation techniques for substrate noise coupling effects in RFICs and introduces isolation structures and design guides to mitigate such effects with the ultimate goal of enhancing the yield of RF and mixed signal SoCs . This is particularly critical when process feature sizes scale down to the nano meter range.
Subject: Engineering, RF and mixed signal Ics, SoC, Substrate Noise, algorithm, circuit, integrated circuit, simulation, system on chip (SoC), tables